Resources

In this section you can download our technical articles and applications notes.
You will also other miscellaneous material to support our products such us video tutorials for calibration and technical documents containing application information.

TRL Calibration for measurement of SMT devices

This note describes how to use TRL calibration using the LA19-13-04B VNA to evaluate SMT devices on printed circuit board. An example using low cost FR4 test PCB is described. The board includes the calibration Standards needed to carry out the TRL calibration.

TRL Calibration for measurement of SMT devices

S-Parameter measurement of SMT device

This note describes a technique for measuring the s-parameters of SMT devices using a low cost FR4 test jig and the LA19-13-03 8 GHz VNA. The jig includes the calibration Standards needed to carry out the VNA calibration to remove the effects of the jig.

S-Parameter measurement of SMT device

Uncertainties report for LA19-13-03

This note describes the calculated uncertainties of the LA19-13-03 Vector Network Analyser. The calculations are based on actual measurements and represent a good indication of the capability of the instrument.

Uncertainties report for LA19-13-03

An Investigation into the Effects of Sampling on the Loop Response and Phase Noise in Phase Locked Loops

Investigation of the effects of sampling on the loop response and phase noise performance of Phase Locked Loops (PLLs). These effects are often ignored in continuous-time models used by simulations. This paper shows why modelling the effects of sampling is important, especially when the loop bandwidth is large.

Analysis of Phase Noise in Sampled PLL

Analysis of phase noise in sampled phase locked loops. This paper provides an in-depth analysis of the characteristics of sampled PLLs and in particular highlights the effects on phase noise at the sampling or comparison frequency.

Analysis of Phase Noise in Sampled PLL

Applications Note LAP03 (LA19-13-02)

Applications Note LAP03 describes calibration procedures for the LA19-13-02 Low  cost Vector Network Analyser including use of the Iss2 calibration kits which enable a full calibration to be carried out with a single kit when the DUT is non-insertable. It also describes the measurement uncertainties.

Applications Note LAP03 (LA19-13-02)

LA19-13-01 3 GHz VNA Calibration and Measurement Uncertainty, Ref LAP02 v1.2

The calibration and measurement uncertainties of the LA19-13-01 Low cost Vector Network Analyser are assessed jointly by the UK’s National Physical Laboratory and LA Techniques Ltd., The Note also contains applications information.

Design Considerations and Performance Requirements for High Speed Driver Amplifiers, Ref. LAP01

This Technical Note takes a look at the background to the bandwidth and phase linearity requirements of high speed driver amplifiers. It also describes popular amplifier circuit techniques and construction technologies used to realize high performance driver amplifiers.

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